"Lock-in thermography for defect localization and thermal characterization ..."

Morgane Mousnier et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.014

access: closed

type: Journal Article

metadata version: 2020-03-13

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Morgane Mousnier, Kévin Sanchez, Elsa Locatelli, Thierry Lebey, Vincent Bley:
Lock-in thermography for defect localization and thermal characterization for space application. Microelectron. Reliab. 88-90: 67-74 (2018)

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