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"Electro- and thermo-migration induced failure mechanisms in Package on ..."
Lutz Meinshausen, Kirsten Weide-Zaage, Hélène Frémont (2012)
- Lutz Meinshausen, Kirsten Weide-Zaage, Hélène Frémont:
Electro- and thermo-migration induced failure mechanisms in Package on Package. Microelectron. Reliab. 52(12): 2889-2906 (2012)
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