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"Migration induced material transport in Cu-Sn IMC and SnAgCu microbumps."

Lutz Meinshausen, Kirsten Weide-Zaage, Hélène Frémont (2011)

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DOI: 10.1016/J.MICROREL.2011.06.032

access: closed

type: Journal Article

metadata version: 2020-02-22

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Lutz Meinshausen, Kirsten Weide-Zaage, Hélène Frémont:
Migration induced material transport in Cu-Sn IMC and SnAgCu microbumps. Microelectron. Reliab. 51(9-11): 1860-1864 (2011)

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