"Compliance current dominates evolution of NiSi2 defect size in ..."

Sen Mei et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.12.037

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type: Journal Article

metadata version: 2022-10-02

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Sen Mei, Michel Bosman, Nagarajan Raghavan, Xing Wu, Kin Leong Pey:
Compliance current dominates evolution of NiSi₂ defect size in Ni/dielectric/Si RRAM devices. Microelectron. Reliab. 61: 71-77 (2016)

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