"Characterization and modeling of laser-induced single-event burn-out in ..."

Nogaye Mbaye et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.113

access: closed

type: Journal Article

metadata version: 2021-03-29

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Nogaye Mbaye, Vincent Pouget, Frédéric Darracq, Dean Lewis:
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes. Microelectron. Reliab. 53(9-11): 1315-1319 (2013)

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