"Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and ..."

Denis Marcon et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.052

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type: Journal Article

metadata version: 2022-10-02

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Denis Marcon, John Viaene, Paola Favia, Hugo Bender, Xuanwu Kang, Silvia Lenci, Steve Stoffels, Stefaan Decoutere:
Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and output current drop. Microelectron. Reliab. 52(9-10): 2188-2193 (2012)

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