"Characterisation and modelling of parasitic effects and failure mechanisms ..."

Nathalie Malbert et al. (2009)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2009.07.015

access: closed

type: Journal Article

metadata version: 2020-04-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/MalbertLCSHJDDDOBBC09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MalbertLCSHJDDDOBBC09
Nathalie Malbert, Nathalie Labat, Arnaud Curutchet, C. Sury, V. Hoel, J.-C. de Jaeger, Nicolas Defrance, Y. Douvry, Christian Dua, Mourad Oualli, C. Bru-Chevallier, Jean-Marie Bluet, W. Chikhaoui:
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs. Microelectron. Reliab. 49(9-11): 1216-1221 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.