"Modified single cantilever adhesion test for EMC/PSR interface in thin ..."

Kenny Mahan et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.05.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Kenny Mahan, Byung Kim, Bulong Wu, Bongtae Han, Ilho Kim, Hojeong Moon, Young Nam Hwang:
Modified single cantilever adhesion test for EMC/PSR interface in thin semiconductor packages. Microelectron. Reliab. 63: 134-141 (2016)

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