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"Degradation behaviors of GaN light-emitting diodes under high-temperature ..."
J. Liu et al. (2012)
- J. Liu, Hei Wong
, Sik-Lam Siu, Chi-Wah Kok, Valeriu Filip
:
Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing. Microelectron. Reliab. 52(8): 1636-1639 (2012)
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