"Influence of polysilicon-gate depletion on the subthreshold behavior of ..."

Juin J. Liou et al. (2002)

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DOI: 10.1016/S0026-2714(01)00259-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, Ching-Sung Ho:
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. Microelectron. Reliab. 42(3): 343-347 (2002)

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