"High-kappa related reliability issues in advanced non-volatile memories."

Luca Larcher, Andrea Padovani (2010)

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DOI: 10.1016/J.MICROREL.2010.07.099

access: closed

type: Journal Article

metadata version: 2020-10-26

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Luca Larcher, Andrea Padovani:
High-kappa related reliability issues in advanced non-volatile memories. Microelectron. Reliab. 50(9-11): 1251-1258 (2010)

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