"Low frequency noise as a reliability diagnostic tool in compound ..."

Nathalie Labat et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.035

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type: Journal Article

metadata version: 2020-02-22

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Nathalie Labat, Nathalie Malbert, Cristell Maneux, André Touboul:
Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors. Microelectron. Reliab. 44(9-11): 1361-1368 (2004)

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