"Degradation mechanisms induced by thermal and bias stresses in InP HEMTs."

Nathalie Labat et al. (2002)

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DOI: 10.1016/S0026-2714(02)00193-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nathalie Labat, Nathalie Malbert, Benoit Lambert, André Touboul, F. Garat, B. Proust:
Degradation mechanisms induced by thermal and bias stresses in InP HEMTs. Microelectron. Reliab. 42(9-11): 1575-1580 (2002)

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