"Proceedings of the 28th European Symposium on the reliability of electron ..."

Nathalie Labat et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.08.002

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type: Journal Article

metadata version: 2020-02-22

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Nathalie Labat, François Marc, Hélène Frémont, Marise Bafleur:
Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis. Microelectron. Reliab. 76-77: 1-5 (2017)

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