"Reliability of Diode-Integrated SiC Power MOSFET(DioMOS)."

Osamu Kusumoto et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.11.033

access: closed

type: Journal Article

metadata version: 2020-10-26

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Osamu Kusumoto, Atsushi Ohoka, Nobuyuki Horikawa, Kohtaro Tanaka, Masahiko Niwayama, Masao Uchida, Yoshihiko Kanzawa, Kazuyuki Sawada, Tetsuzo Ueda:
Reliability of Diode-Integrated SiC Power MOSFET(DioMOS). Microelectron. Reliab. 58: 158-163 (2016)

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