"Improvement of integrated circuit testing reliability by using the defect ..."

Dominik Kasprowicz, Witold A. Pleskacz (2003)

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DOI: 10.1016/S0026-2714(03)00092-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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Dominik Kasprowicz, Witold A. Pleskacz:
Improvement of integrated circuit testing reliability by using the defect based approach. Microelectron. Reliab. 43(6): 945-953 (2003)

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