"Characterization and reliability of nMOSFETs on flexible substrates under ..."

Hsuan-Ling Kao et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.12.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hsuan-Ling Kao, Chih-Sheng Yeh, Meng-Ting Chen, Hsien-Chin Chiu, Li-Chun Chang:
Characterization and reliability of nMOSFETs on flexible substrates under mechanical strain. Microelectron. Reliab. 52(6): 999-1004 (2012)

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