"Conduction instability of amorphous InGaZnO thin-film transistors under ..."

Jung Han Kang, Edward Namkyu Cho, Ilgu Yun (2014)

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DOI: 10.1016/J.MICROREL.2014.07.066

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jung Han Kang, Edward Namkyu Cho, Ilgu Yun:
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. Microelectron. Reliab. 54(9-10): 2164-2166 (2014)

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