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Edward Namkyu Cho

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2010 – 2019

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2015
[j5]
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  - journals/mr/ChoSY15
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Edward Namkyu Cho, Yong-Hyeon Shin, Ilgu Yun:
An analytical avalanche breakdown model for double gate MOSFET. Microelectron. Reliab. 55(1): 38-41 (2015)
2014
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Jung Han Kang, Edward Namkyu Cho, Ilgu Yun:
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. Microelectron. Reliab. 54(9-10): 2164-2166 (2014)
2012
[j3]
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  - journals/eswa/ChoMKY12
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Edward Namkyu Cho, Pyung Moon, Chang Eun Kim, Ilgu Yun:
Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm. Expert Syst. Appl. 39(10): 8885-8889 (2012)
[j2]
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  - journals/mr/ParkCY12
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Suehye Park, Edward Namkyu Cho, Ilgu Yun:
Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors. Microelectron. Reliab. 52(9-10): 2215-2219 (2012)
2011
[j1]
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Edward Namkyu Cho, Jung Han Kang, Ilgu Yun:
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors. Microelectron. Reliab. 51(9-11): 1792-1795 (2011)

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