"Forward-stepwise regression analysis for fine leak batch testing of ..."

Changsoo Jang et al. (2010)

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DOI: 10.1016/J.MICROREL.2009.11.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Changsoo Jang, Byeng Dong Youn, Ping F. Wang, Bongtae Han, Suk-Jin Ham:
Forward-stepwise regression analysis for fine leak batch testing of wafer-level hermetic MEMS packages. Microelectron. Reliab. 50(4): 507-513 (2010)

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