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"Study of Area Scaling Effect on Integrated Circuit Reliability Based on ..."
Changsoo Hong et al. (2005)
- Changsoo Hong, Linda S. Milor, Munkang Choi, Tom Lin:
Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models. Microelectron. Reliab. 45(9-11): 1305-1310 (2005)
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