"On the temperature and voltage dependence of short-term negative bias ..."

Ph. Hehenberger et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.040

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ph. Hehenberger, P.-J. Wagner, Hans Reisinger, Tibor Grasser:
On the temperature and voltage dependence of short-term negative bias temperature stress. Microelectron. Reliab. 49(9-11): 1013-1017 (2009)

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