"Extraction of the lateral distribution of interface traps in MOSFETs by a ..."

Jin He et al. (2001)

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DOI: 10.1016/S0026-2714(01)00235-9

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type: Journal Article

metadata version: 2024-06-04

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Jin He, Xing Zhang, Ru Huang, Yangyuan Wang:
Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique. Microelectron. Reliab. 41(12): 1953-1957 (2001)

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