"Prediction of crack growth in IC passivation layers."

Y. T. He et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.05.022

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type: Journal Article

metadata version: 2022-05-18

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Y. T. He, Marcel A. J. van Gils, Willem D. van Driel, G. Q. Zhang, Richard B. R. van Silfhout, Leo J. Ernst:
Prediction of crack growth in IC passivation layers. Microelectron. Reliab. 44(12): 2003-2009 (2004)

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