"The improvement of HEIP immunity using STI engineering at DRAM."

Seung Uk Han et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.039

access: closed

type: Journal Article

metadata version: 2020-02-22

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Seung Uk Han, Youngyoun Lee, Yongdoo Kim, Jemin Park, Junhee Lim, Satoru Yamada, Hyeongsun Hong, Kyupil Lee, Gyoyoung Jin, Eunseung Jung:
The improvement of HEIP immunity using STI engineering at DRAM. Microelectron. Reliab. 76-77: 164-167 (2017)

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