"Different Failure signatures of multiple TLP and HBM Stresses in an ESD ..."

Nicolas Guitard et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.030

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis:
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45(9-11): 1415-1420 (2005)

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