"Stochastic charge trapping in oxides: From random telegraph noise to bias ..."

Tibor Grasser (2012)

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DOI: 10.1016/J.MICROREL.2011.09.002

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type: Journal Article

metadata version: 2020-02-22

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Tibor Grasser:
Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities. Microelectron. Reliab. 52(1): 39-70 (2012)

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