"Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review."

Louis Gerrer et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.01.024

access: closed

type: Journal Article

metadata version: 2023-09-30

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Louis Gerrer, Jie Ding, Salvatore M. Amoroso, Fikru Adamu-Lema, Razaidi Hussin, Dave Reid, Campbell Millar, A. Asenov:
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. Microelectron. Reliab. 54(4): 682-697 (2014)

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