"The coupling effects of temperature, electric current and stress on the ..."

Hong Gao et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.03.019

access: closed

type: Journal Article

metadata version: 2020-09-01

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Hong Gao, Dong Zhang, Li-Lan Gao, Jian-hua Ma:
The coupling effects of temperature, electric current and stress on the adhesion and electrical properties of COG assembly. Microelectron. Reliab. 54(8): 1603-1612 (2014)

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