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"Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm ..."

Xiaoyang Du et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.04.005

access: closed

type: Journal Article

metadata version: 2020-02-22

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Xiaoyang Du, Shurong Dong, Yan Han, Juin J. Liou, Mingxu Huo, You Li, Qiang Cui, Dahai Huang, Demiao Wang:
Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology. Microelectron. Reliab. 48(7): 995-999 (2008)

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