"Prediction of interfacial delamination in stacked IC structures using ..."

Willem D. van Driel et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.05.002

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type: Journal Article

metadata version: 2022-05-18

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Willem D. van Driel, C. J. Liu, G. Q. Zhang, J. H. J. Janssen, Richard B. R. van Silfhout, Marcel A. J. van Gils, Leo J. Ernst:
Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods. Microelectron. Reliab. 44(12): 2019-2027 (2004)

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