"ESD protection structure with reduced capacitance and overshoot voltage ..."

Aihua Dong et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.03.014

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type: Journal Article

metadata version: 2024-05-29

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Aihua Dong, Javier A. Salcedo, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Sirui Luo, Jean-Jacques Hajjar, Juin J. Liou:
ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications. Microelectron. Reliab. 79: 201-205 (2017)

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