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"Charge trapping and reliability characteristics of ultra-thin ..."
P. S. Das, Abhijit Biswas (2010)
- P. S. Das, Abhijit Biswas:
Charge trapping and reliability characteristics of ultra-thin HfYOx films on n-GaAs substrates. Microelectron. Reliab. 50(12): 1924-1930 (2010)
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