"Low-cost backside laser test method to pre-characterize the COTS IC's ..."

Frédéric Darracq et al. (2003)

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DOI: 10.1016/S0026-2714(03)00284-1

access: closed

type: Journal Article

metadata version: 2020-02-22

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Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière:
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectron. Reliab. 43(9-11): 1615-1619 (2003)

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