"Magnetic imaging for resistive, capacitive and inductive devices; from ..."

Nicolas Courjault et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Nicolas Courjault, Philippe Perdu, Fulvio Infante, Thierry Lebey, Vincent Bley:
Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization. Microelectron. Reliab. 55(9-10): 1622-1627 (2015)

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