"Study of layout influence on ruggedness of NPT-IGBT devices by physical ..."

Ignasi Cortés et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.074

access: closed

type: Journal Article

metadata version: 2021-03-30

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Ignasi Cortés, Xavier Perpiñà, Jesús Urresti, Xavier Jordà, José Rebollo:
Study of layout influence on ruggedness of NPT-IGBT devices by physical modelling. Microelectron. Reliab. 52(9-10): 2471-2476 (2012)

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