"Circuit simulation of workload-dependent RTN and BTI based on trap kinetics."

Vinicius V. A. Camargo et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.06.003

access: closed

type: Journal Article

metadata version: 2021-10-14

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Vinicius V. A. Camargo, Ben Kaczer, Tibor Grasser, Gilson I. Wirth:
Circuit simulation of workload-dependent RTN and BTI based on trap kinetics. Microelectron. Reliab. 54(11): 2364-2370 (2014)

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