"Failure mechanism study and immunity modeling of an embedded ..."

Ala Ayed et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.109

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp:
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Microelectron. Reliab. 55(9-10): 2067-2071 (2015)

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