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ORCIDJean-Luc Levant
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2010 – 2019
- 2015
[j6]Ala Ayed, Tristan Dubois
, Jean-Luc Levant, Geneviève Duchamp:
Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. Microelectron. Reliab. 55(9-10): 2067-2071 (2015)- [j5]Ala Ayed, Tristan Dubois, Jean-Luc Levant, Geneviève Duchamp:
A New Method for the Characterization of Electronic Components Immunity. IEEE Trans. Instrum. Meas. 64(9): 2496-2503 (2015) - [c3]Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, Frédéric Lafon:
Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions. EMC Compo 2015: 252-257 - 2011
- [j4]Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot:
Control of the electromagnetic compatibility: An issue for IC reliability. Microelectron. Reliab. 51(9-11): 1493-1497 (2011)
2000 – 2009
- 2009
- [j3]Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant:
Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. Microelectron. Reliab. 49(9-11): 963-966 (2009) - 2004
- [j2]Jean-Luc Levant, Mohammed Ramdani, Richard Perdriau:
ICEM modelling of microcontroller current activity. Microelectron. J. 35(6): 501-507 (2004) - [j1]Richard Perdriau, Mohammed Ramdani, Jean-Luc Levant, Eric Tinlot, Anne-Marie Trullemans-Anckaert:
An EMC-oriented VHDL-AMS simulation methodology for dynamic current activity assessment. Microelectron. J. 35(6): 541-546 (2004) - [c2]Anne-Marie Trullemans-Anckaert, Richard Perdriau, Mohammed Ramdani, Jean-Luc Levant:
Early Prediction of Conducted-Mode Emission of complex IC's. FDL 2004: 135-144 - 2002
- [c1]Jean-Luc Levant, Mohammed Ramdani:
An EMC-Compliant Design Method of High-Density Integrated Circuits. DATE 2002: 1115
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