"ICMAT 2011 - Reliability and variability of semiconductor devices and ICs."

Asen Asenov et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.05.003

access: closed

type: Journal Article

metadata version: 2020-12-29

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Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou:
ICMAT 2011 - Reliability and variability of semiconductor devices and ICs. Microelectron. Reliab. 52(8): 1531 (2012)

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