"An analytical model for read static noise margin including soft oxide ..."

Behrouz Afzal et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.01.009

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type: Journal Article

metadata version: 2023-03-21

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Behrouz Afzal, Behzad Ebrahimi, Ali Afzali-Kusha, Hamid Mahmoodi:
An analytical model for read static noise margin including soft oxide breakdown, negative and positive bias temperature instabilities. Microelectron. Reliab. 53(5): 670-675 (2013)

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