"Modeling read SNM considering both soft oxide breakdown and negative bias ..."

Behrouz Afzal et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.07.026

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type: Journal Article

metadata version: 2023-03-21

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Behrouz Afzal, Behzad Ebrahimi, Ali Afzali-Kusha, Hamid Mahmoodi:
Modeling read SNM considering both soft oxide breakdown and negative bias temperature instability. Microelectron. Reliab. 52(12): 2948-2954 (2012)

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