"Scattering parameter approach applied to the stability analysis of power ..."

Carmine Abbate et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.128

access: closed

type: Journal Article

metadata version: 2020-02-22

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Carmine Abbate, Giovanni Busatto, Francesco Iannuzzo, Cesare Ronsisvalle, Annunziata Sanseverino, Francesco Velardi:
Scattering parameter approach applied to the stability analysis of power IGBTs in short circuit. Microelectron. Reliab. 53(9-11): 1707-1712 (2013)

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