"Thermal damage in SiC Schottky diodes induced by SE heavy ions."

Carmine Abbate et al. (2014)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2014.07.081

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/AbbateBCDGISV14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/AbbateBCDGISV14
Carmine Abbate, Giovanni Busatto, Paolo Cova, Nicola Delmonte, Francesco Giuliani, Francesco Iannuzzo, Annunziata Sanseverino, Francesco Velardi:
Thermal damage in SiC Schottky diodes induced by SE heavy ions. Microelectron. Reliab. 54(9-10): 2200-2206 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.