"Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm ..."

Zhaonian Yang et al. (2018)

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DOI: 10.1016/J.MEJO.2018.05.011

access: closed

type: Journal Article

metadata version: 2021-10-07

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Zhaonian Yang, Yuan Yang, Ningmei Yu, Juin J. Liou:
Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process. Microelectron. J. 78: 88-93 (2018)

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