"The role of stacking faults and their associated 0.13 ev acceptor state in ..."

Klaus Thonke et al. (2009)

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DOI: 10.1016/J.MEJO.2008.07.031

access: closed

type: Journal Article

metadata version: 2023-09-30

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Klaus Thonke, Martin Schirra, Raoul Schneider, Anton Reiser, Günther M. Prinz, Martin Feneberg, Johannes Biskupek, Ute Kaiser, Rolf Sauer:
The role of stacking faults and their associated 0.13 ev acceptor state in doped and undoped ZnO layers and nanostructures. Microelectron. J. 40(2): 210-214 (2009)

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