"Monitoring of carrier lifetime distribution in high power semiconductor ..."

J. Kozísek, Z. Machacek, Vitezslav Benda (2008)

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DOI: 10.1016/J.MEJO.2007.11.015

access: closed

type: Journal Article

metadata version: 2023-10-18

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J. Kozísek, Z. Machacek, Vitezslav Benda:
Monitoring of carrier lifetime distribution in high power semiconductor device technology. Microelectron. J. 39(6): 884-889 (2008)

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