"Methods for automated detection of plagiarism in integrated-circuit layouts."

Dominik Kasprowicz, Hilekaan Wada (2014)

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DOI: 10.1016/J.MEJO.2014.04.023

access: closed

type: Journal Article

metadata version: 2020-02-22

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Dominik Kasprowicz, Hilekaan Wada:
Methods for automated detection of plagiarism in integrated-circuit layouts. Microelectron. J. 45(9): 1212-1219 (2014)

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