"Modelling of hot-carrier degradation and its application for analog design ..."

Benoit Dubois et al. (2009)

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DOI: 10.1016/J.MEJO.2008.03.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Benoit Dubois, Jean-Baptiste Kammerer, Luc Hébrard, Francis Braun:
Modelling of hot-carrier degradation and its application for analog design for reliability. Microelectron. J. 40(9): 1274-1280 (2009)

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