"Pseudorandom BIST for test and characterization of linear and nonlinear MEMS."

Achraf Dhayni et al. (2009)

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DOI: 10.1016/J.MEJO.2008.05.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Achraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur, Emmanuel Simeu:
Pseudorandom BIST for test and characterization of linear and nonlinear MEMS. Microelectron. J. 40(7): 1054-1061 (2009)

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